Patent · US Active

Method and device for fault detection

US10585738B2 · kind B2 · utility

2Cited by

5References

20Claims

0Family size

Assignees

PROTON WORLD INTERNATIONAL N.V. · BE
STMicroelectronics (Rousset) SAS · FR

Inventors

Fabrice Marinet · Gardanne, FR
Jean-Louis Modave · Ottignies, BE
Gilles Van Assche · Woluwe-Saint-Lambert - Sint-Lambrechts-Woluwe, BE
Ronny Van Keer · Hoeilaart, BE

Key dates

Filing date	Jan 14, 2016
Grant date	Mar 10, 2020
Priority date	—
Expiry date	Apr 11, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG06F2207/7219
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

The disclosure concerns a method implemented by a processing device. The method includes performing a first execution by the processing device of a computing function based on one or more initial parameters stored in a first memory device. The execution of the computing function generates one or more modified values of at least one of the initial parameters, wherein during the first execution the one or more initial parameters are read from the first memory device and the one or more modified values are stored in a second memory device. The method also includes performing a second execution by the processing device of the computing function based on the one or more initial parameters stored in the first memory device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.