Measurement apparatus of vectorial optical fields
US10587345B2 · kind B2 · utility
2Cited by
3References
4Claims
0Family size
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Key dates
| Filing date | Apr 26, 2019 |
| Grant date | Mar 10, 2020 |
| Priority date | — |
| Expiry date | Apr 26, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B10/70
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
An apparatus measures the transverse profile of vectorial optical field beams, including at least the directional intensity complex amplitude, the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.