Patent · US Active

Method of preparing a sample for microstructure diagnostics, and sample for microstructure diagnostics

US10591393B2 · kind B2 · utility

1Cited by
2References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 3, 2016
Grant dateMar 17, 2020
Priority date
Expiry dateMar 20, 2038

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/31749
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A sample for microstructure diagnostics includes a sample body holder with accommodation structures to accommodate a sample body in a defined accommodation position; and at least one sample body produced separately from the sample body holder, the sample body having at least one solid handling portion and, adjoining the handling portion, a target portion thinner relative to the handling portion, the target portion being delimited at a narrow side by a sample body top side and, laterally, by side faces extending in a perpendicular or oblique manner in relation to the sample body top side, with the sample body being affixed to the accommodation structures in the accommodation position.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.