Systems, devices, and methods for sample integrity verification
US10591409B2 · kind B2 · utility
2Cited by
1References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 29, 2016 |
| Grant date | Mar 17, 2020 |
| Priority date | — |
| Expiry date | Aug 29, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2035/00831
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The devices, systems, and methods disclosed herein provide sample verification capabilities in a single device or system. Devices are disclosed herein. Systems including these devices are also provided. These devices and systems may be configured for verifying sample integrity prior to a subject leaving a sample collection site so that any further samples or other corrective action can occur without having to make a separate visit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.