In-line laser profilometry inspection system
US10591420B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 30, 2019 |
| Grant date | Mar 17, 2020 |
| Priority date | — |
| Expiry date | Apr 30, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/06113
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An in-line laser profilometry inspection system broadly comprises a first laser, a first sensor, a second laser, a second sensor, a camera, a calibration standard, and an interface. The lasers transmit first and second light signals to a stringer charge or other part. The sensors detect the light signals reflecting off first and second edge walls of the part. The camera obtains a top-down image of the part. The calibration standard provides structure for calibrating the inspection system via the lasers and sensors. The interface allows a user to oversee part inspection. Data generated from the reflected light signals corresponding to a part profile may be analyzed based on at least first and second derivatives of the part profile such that the part is inspected during a cutting procedure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.