Devices, methods and kits for sample characterization
US10591488B2 · kind B2 · utility
6Cited by
85References
30Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 29, 2019 |
| Grant date | Mar 17, 2020 |
| Priority date | — |
| Expiry date | Jan 29, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2001/4038
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Devices and methods for characterization of samples are provided. Samples may comprise one or more analytes. Some methods described herein include performing enrichment steps on a device. Some methods described herein include performing mobilization of analytes. Analytes may then be further processed and characterized.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.