Measurement apparatus

US10591522B2 · kind B2 · utility

Assignee

• Rohde & Schwarz GmbH & Co. KG · DE

Inventors

• Werner Held · Pöcking, DE
• Martin Leibfritz · Aying, DE
• Marcel Ruf · Erlangen, DE

Key dates

• Filing date: Oct 21, 2016
• Grant date: Mar 17, 2020
• Expiry date: Dec 2, 2037

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2601
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A measurement apparatus (1) comprising a high frequency measurement unit (2) adapted to measure high frequency parameters (HFP) of a device under test (DUT) connected to ports of said measurement apparatus (1) and a multimeter unit (3) adapted to measure DC characteristics parameters (DCP) of said device under test (DUT) connected via control signal lines (CL) to a control bus interface (6) of said measurement apparatus (1).