Methods and arrangements for configuring industrial inspection systems
US10593007B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 17, 2017 |
| Grant date | Mar 17, 2020 |
| Priority date | — |
| Expiry date | Nov 17, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2201/0052
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
In computer vision systems that need to decode machine-readable indicia from captured imagery, it is critical to select imaging parameters (e.g., exposure interval, exposure aperture, camera gain, intensity and duration of supplemental illumination) that best allow detection of subtle features from imagery. In illustrative embodiments, a Shannon entropy metric or a KL divergence metric is used to guide selection of an optimal set of imaging parameters. In accordance with other aspects of the technology, different strategies identify which spatial locations within captured imagery should be successively examined for machine readable indicia, in order to have a greatest likelihood of success, within a smallest interval of time. A great variety of other features and arrangements are also detailed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.