Imaging mass spectrometer
US10593533B2 · kind B2 · utility
20Cited by
60References
19Claims
0Family size
Assignees
Inventors
Key dates
| Filing date | Nov 16, 2016 |
| Grant date | Mar 17, 2020 |
| Priority date | — |
| Expiry date | Nov 16, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/401
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A time-of-flight mass spectrometer is disclosed comprising: an ion deflector (305) configured to deflect ions to different positions in a first array of positions at different times; a position sensitive ion detector (187); and ion optics (180) arranged and configured to guide ions from the first array of positions to the position sensitive detector (187) so as to map ions from the first array of positions to a second array of positions on the position sensitive detector (187); wherein the ion optics includes at least one ion mirror for reflecting the ions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.