Methods and systems for imaging and analyzing wood blanks and billets
US10598610B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 26, 2019 |
| Grant date | Mar 24, 2020 |
| Priority date | — |
| Expiry date | Jul 26, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/633
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray system for analyzing materials includes an X-ray source, an X-ray detector and a sample platform, and a controller configured to generate a radiograph of material on the sample platform by selectively energizing the X-ray source to emit X-rays through the material to the X-ray detector along a scanned length of the material, calculate a plurality of measured density values along the scanned length of the material, calculate a plurality of model density values of the material from one or more of settings of the X-ray system, characteristics of the material along the scanned length of the material, and a longitudinal density variation for a particular application, compute a difference between the measured density values and the model density values and determine if the longitudinal density variation has been exceeded, and provide an alert as to whether the longitudinal density variation has been exceeded.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.