Single-shot method for edge illumination X-ray phase-contrast tomography
US10598612B2 · kind B2 · utility
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Key dates
| Filing date | Feb 1, 2018 |
| Grant date | Mar 24, 2020 |
| Priority date | — |
| Expiry date | Feb 1, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10116
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and systems of reconstructing a complex-valued X-ray refractive index distribution of an object having undergone X-ray phase-contrast tomography. The method includes acquiring at least one X-ray image of an object using an edge illumination X-ray phase-contrast tomography (EIXPCT) model, discretizing the model, jointly reconstructing the complex-valued refractive index distribution of the object using penalized least squares estimation of real and imaginary parts of the distribution, and solving the penalized least squares estimation using a batch gradient algorithm.
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