Three-dimensional measurement apparatus, three-dimensional measurement method and program
US10600193B2 · kind B2 · utility
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2References
14Claims
0Family size
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Key dates
| Filing date | Oct 22, 2018 |
| Grant date | Mar 24, 2020 |
| Priority date | — |
| Expiry date | Nov 9, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/74
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Three-dimensional measurement is performed by projecting patterned light having a hybrid pattern Ph onto a measurement target. The hybrid pattern Ph is a pattern in which a random pattern Pr is superimposed on a structured light pattern Ps, and is arranged in pattern such that the random pattern Pr and the structured light pattern Ps do not interfere mutually.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.