Precision calibration method of attitude measuring system
US10605619B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 4, 2016 |
| Grant date | Mar 31, 2020 |
| Priority date | — |
| Expiry date | Jul 5, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01P15/18
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A precision calibration method of attitude measuring systems is provided. The precision calibration method of attitude measuring systems includes the following steps: calibrating a zero-deviation, a scale coefficient, and a non-orthogonal angle between axes of an accelerometer to the attitude measuring system via an ellipsoid fitting model (S1); compensating original data of the accelerometer using a calculated ellipsoid parameter (S2); calibrating an electronic compass via the ellipsoid fitting model according to compensated accelerometer data (S3); compensating original electronic compass data by the calculated ellipsoid parameter (S4); calculating an attitude according to the compensated data of the accelerometer and compensated data of the electronic compass (S5). The above steps of the method have a reliable calibration result and a high precision with a less time consumption of calibration.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.