Patent · US Active

Method for calibrating a temperature control in thermal analyses of samples

US10605677B2 · kind B2 · utility

0Cited by

6References

14Claims

0Family size

Assignee

NETZSCH-Gerätebau GmbH · DE

Inventors

Martin Brunner · Pforzheim, DE
André Lindemann · Merseburg, DE

Key dates

Filing date	Aug 23, 2017
Grant date	Mar 31, 2020
Priority date	—
Expiry date	Jun 21, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG01N25/04
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for calibrating thermal analysis device includes: photothermal measurements on a sample consecutively held in the plurality of sample holders, or on a plurality of similar samples, which are in each case held in one of the plurality of sample holders, wherein a first side of the respective sample is irradiated with an electromagnetic excitation pulse and a thermal radiation emitted by a second side of this sample is captured; comparing results of the photothermal measurements for the plurality of sample holders; in each case determining at least one correction parameter for each sample holder based on a result of the comparison; and calibrating the temperature measuring system of the device and/or the temperature control systems of the device based on the determined correction parameters.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.