Sensor subsystems for non-contact voltage measurement devices
US10605832B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 5, 2017 |
| Grant date | Mar 31, 2020 |
| Priority date | — |
| Expiry date | Mar 28, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R19/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for measuring alternating current (AC) voltage of an insulated conductor are provided, without requiring a galvanic connection between the conductor and a test electrode. A non-galvanic contact voltage measurement device includes a conductive sensor, an internal ground guard, and a reference shield. A reference voltage source is electrically coupleable between the guard and the reference shield to generate an AC reference voltage which causes a reference current to pass through the conductive sensor. Sensor subsystems may be arranged in layers (e.g., stacked layers, nested layers, or components) of conductors and insulators. The sensor subsystems may be packaged as formed sheets, flexible circuits, integrated circuit (IC) chips, nested components, printed circuit boards (PCBs), etc. The sensor subsystems may be electrically coupled to suitable processing or control circuitry of a non-contact voltage measurement device to allow for measurement of voltages in insulated conductors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.