Bendable x-ray detector with TFT backplane in the neutral plane
US10608041B2 · kind B2 · utility
1Cited by
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18Claims
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Key dates
| Filing date | Apr 12, 2018 |
| Grant date | Mar 31, 2020 |
| Priority date | — |
| Expiry date | Apr 12, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F39/016
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
Transitioning conventional x-ray detector materials and structures to bendable or flexible (e.g., plastic) substrates makes them rugged against breakage when dropped but exposes the detectors to damage if bent. Disclosed are bendable digital x-ray detector structures that are rugged with regard to bending as well as dropping. The structures provide strain matching between layers so that a detector backplane is in and/or near the mechanical neutral plane and therefore less susceptible to bending stress.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.