Patent · US Active

Beam-based measurement configuration

US10609611B2 · kind B2 · utility

12Cited by
1References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 4, 2018
Grant dateMar 31, 2020
Priority date
Expiry dateMay 4, 2038

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04W36/302
  • WIPO fieldDigital communication
  • WIPO sectorElectrical engineering

Abstract

A wireless device may receive from a first base station, measurement configuration parameters of a measurement of the wireless device. The measurement configuration parameters comprise first beam identifiers of a first plurality of beams, second beam identifiers of a second plurality of beams and a measurement event indicating that a second combined reference signal measurement value of the second plurality of beams exceeds a first combined reference signal measurement value of the first plurality of beams by more than a first offset value. The first plurality of beams and the second plurality of beams are monitored to determine an occurrence of the measurement event. The first base station transmits a measurement report in response to the occurrence of the first measurement event. The measurement report comprises: the first combined reference signal measurement value and the second combined reference signal measurement value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.