Alarm tuning using alarm and process data for condition monitoring
US10614702B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 21, 2018 |
| Grant date | Apr 7, 2020 |
| Priority date | — |
| Expiry date | Oct 10, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/04847
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A method of tuning alarm parameters for condition monitoring of processing equipment in an industrial processing facility (IPF). For a selected process variable a first histogram is displayed from stored historical process data. An initial process alarm threshold is overlayed on the first histogram, and ON-time delay alarms are computed using an initial zero ON-time delay that would have occurred. A second histogram displays a distribution of alarms run length from alarm event data with the zero ON-time delay. Alarm tuning adjusts the initial process alarm threshold and/or the initial time delay, and an alarm performance is then evaluated from viewing the first and second histogram or viewing a hybrid display providing a time series plot including alarm event and process data, and the adjusting is repeated until the evaluating is deemed satisfactory. The new alarm tuning values are implemented to a control system of the IPF.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.