Patent · US Active

System and method for detecting a condition of a seal

US10620132B2 · kind B2 · utility

2Cited by
14References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 11, 2018
Grant dateApr 14, 2020
Priority date—
Expiry dateSep 11, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/888
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A seal analysis system for measuring and analyzing a seal and a mating hardware configured to detect a defect and to analyze a condition of at least one of the seal and the mating hardware and includes a sensor and an electrical processing circuit. The sensor may be in a form of an optical inspection device, a laser scanner, a phone, or an ultrasound scanner. Additionally, the sensor may be provided to take a photo or video. The electrical processing circuit may be built in to the sensor or it may be a separate unit configured to communicate with the sensor. The electrical processing circuit may be configured to compare a condition of a seal and/or mating hardware against pre-set criteria.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.