Method for detecting defect of metal plate
US10620163B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Nov 1, 2017 |
| Grant date | Apr 14, 2020 |
| Priority date | — |
| Expiry date | Oct 4, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2634
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for detecting a defect of a metal plate includes selecting N controllable emitting electromagnetic acoustic transducers EMATs as excitation transducers, and selecting M omnidirectionally receiving EMATs as receiving transducers, exciting an ultrasonic guided wave in a metal plate by a nth controllable emitting EMAT with a predetermined emission angle; determining whether each of M1 omnidirectionally receiving EMATs and the nth controllable emitting EMAT form a scattering group; for the scattering group, solving a position of a scattering point and a direction of a scattering side according to a distance between Tn and Rml, the emission angle and a travel time of the ultrasonic guided wave; performing a curve fitting on all the scattering points in directions of respective scattering sides to obtain a contour image of the defect.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.