Patent · US Active

Systems and methods for determining relationships between defects

US10620618B2 · kind B2 · utility

0Cited by

48References

17Claims

0Family size

Assignee

Palantir Technologies Inc. · US

Inventors

Andrew Poh · San Francisco, US
Andre Frederico Cavalheiro Menck · New York, US
Arion Sprague · San Francisco, US
Benjamin Grabham · London, GB
Benjamin Lee · Palo Alto, US
Bianca Rahill-Marier · London, GB
Gregoire Omont · London, GB
Jim Inoue · Kirkland, US
Jonah Scheinerman · New York, US
Maciej Albin · London, GB
Myles Scolnick · New York, US
Paul Gribelyuk · Jersey City, US
Steven Fackler · Menlo Park, US
Tam-Sanh Nguyen · Olney, US
Thomas Powell · San Francisco, US
William Seaton · Dexter, US

Key dates

Filing date	Dec 20, 2016
Grant date	Apr 14, 2020
Priority date	—
Expiry date	Dec 20, 2036

Classification

Technology area (CPC H)Electricity
CPC primaryH01L22/20
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Systems and methods are provided for identifying relationships between defects. The system may obtain defect items and associated information. Defect items may be compared to one another based on their attributes to determine how related they are. According to the comparisons, defect items may be grouped together into issue items for further analysis by a user. The system may further update a defect comparison model according to user interaction with defect items.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.