Techniques for providing signal calibration data
US10622083B2 · kind B2 · utility
1Cited by
1References
20Claims
0Family size
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Key dates
| Filing date | Oct 23, 2018 |
| Grant date | Apr 14, 2020 |
| Priority date | — |
| Expiry date | Oct 23, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/028
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In connection with data pin timing calibration with a strobe signal, examples provide for determination of pass/fail status of a pin from multiple pass/fail results in a single operation. Determination of pass/fail results for multiple pins based on multiple applied trim offsets can be made in parallel. Accordingly, a time to determine pass/fail results from multiple trim values for a pin can be reduced, which can enable faster power-up of NAND flash devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.