Aperture measuring device and an aperture measuring method
US10627207B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | May 11, 2018 |
| Grant date | Apr 21, 2020 |
| Priority date | — |
| Expiry date | Jul 27, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B3/50
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An aperture measuring device and aperture measuring method for measuring the size of the aperture of a through-hole in a conductive structure is described to reduce the aperture measurement time and improve the working efficiency. The aperture measuring device includes: an aperture testing component for being inserted into the through-hole, wherein the aperture measuring device includes a plurality of resistor segments with different diameters, the individual resistor segments being successively connected in series in an order of the sizes of their diameters; and a measuring module for measuring the resistance value of a resistor segment unable to be inserted into the through-hole in the aperture testing component to determine the size of the aperture of the through-hole.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.