Patent · US Active

Low resistance surface contact topography mapping

US10627208B2 · kind B2 · utility

0Cited by
7References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 5, 2017
Grant dateApr 21, 2020
Priority date
Expiry dateJan 18, 2038

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02T50/60
  • WIPO fieldEngines, pumps, turbines
  • WIPO sectorMechanical engineering

Abstract

A system and method for testing rotor stack assemblies having a plurality of rotor disks is disclosed. A measurement system for measuring at least one electrical characteristic of the plurality of rotor disks is used with a computer electronically connected to the measurement system for capturing data from the measurement system. Software associated with the computer transforms the data into output used to determine flange joint contact topography in the plurality of rotor disks.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.