Optical device for characterization of a sample
US10627227B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Sep 16, 2016 |
| Grant date | Apr 21, 2020 |
| Priority date | — |
| Expiry date | Sep 16, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B5/285
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to an optical device for characterization of a sample (3) comprising —a source (5) of parallel or collimated light, having an emission spectrum that is continuous over an observation wavelength range of at least 50 nm width, for illuminating the sample (3), —a detector (7) of light scattered by the sample (3), operating in said observation wavelength range, —a filter (9) for specific spectral weighting arranged on an optical path upstream of the detector (7) of the scattered light, and —a processing unit (11) for processing the measurement signal in order to extract a characterization parameter of the sample (3).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.