Manufacturing advanced test probes
US10627427B2 · kind B2 · utility
0Cited by
20References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 26, 2017 |
| Grant date | Apr 21, 2020 |
| Priority date | — |
| Expiry date | Apr 29, 2038 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49156
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Embodiments relate to the formation of test probes. One method includes providing a bulk sheet of an electrically conductive material. A laser is used to cut through the bulk sheet in a predetermined pattern to form a test probe. Other embodiments are described and claimed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.