Anti-reflective film
US10627547B2 · kind B2 · utility
5Cited by
11References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 9, 2017 |
| Grant date | Apr 21, 2020 |
| Priority date | — |
| Expiry date | Mar 9, 2037 |
Classification
- Technology area (CPC C)Chemistry; Metallurgy
- CPC primaryC09D7/61
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to an anti-reflective film exhibiting one or more peaks at a scattering vector (qmax) of 0.0758 to 0.1256 nm−1, in a graph showing a log value of scattering intensity to a scattering vector defined in small-angle X-ray scattering.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.