Sampling of scanning device
US10628971B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 27, 2017 |
| Grant date | Apr 21, 2020 |
| Priority date | — |
| Expiry date | Apr 22, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/427
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure provides a sampling method and sampling apparatus of a scanning device. In at least one example, the sampling method comprises acquiring a ray attenuation variation at each of a plurality of scanning angles of the scanning device, determining a corrected sampling interval at each of the scanning angles of the scanning device by adjusting an initial sampling interval at each of the scanning angles of the scanning device according to the ray attenuation variation at each of scanning angles, and performing actual sampling according to the corrected sampling interval at each of the scanning angles of the scanning device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.