Imaging mass spectrometer
US10629425B2 · kind B2 · utility
20Cited by
60References
19Claims
0Family size
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Key dates
| Filing date | Nov 16, 2016 |
| Grant date | Apr 21, 2020 |
| Priority date | — |
| Expiry date | Nov 16, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/46
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A time-of-flight mass spectrometer is disclosed comprising ion optics that map an array of ions at an ion source array (71) to a corresponding array of positions on a position sensitive ion detector (79). The ion optics include at least one gridless ion mirror (76) for reflecting ions, which may compensate for various aberrations and allows the spectrometer to have relatively high mass and spatial resolutions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.