Device for measuring endogenous deformations
US10634486B2 · kind B2 · utility
2Cited by
2References
15Claims
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Key dates
| Filing date | Apr 27, 2017 |
| Grant date | Apr 28, 2020 |
| Priority date | — |
| Expiry date | Apr 27, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/083
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Device for measuring the endogenous deformations of a structure of materials, during the transition of said structure from a liquid phase to a solid phase, comprising:
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.