Method for selecting wave height threshold
US10634495B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 21, 2019 |
| Grant date | Apr 28, 2020 |
| Priority date | — |
| Expiry date | Aug 21, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2111/08
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present application relates to a method for selecting a wave height threshold, based on a target location, original wave height samples are acquired, and a wave height threshold interval are obtained; combined with wave height threshold and based on GPD and specified return period, a design wave height Hsi,j corresponding to each threshold within the wave height threshold interval is calculated according to the sample wave height values which are greater that the threshold; a difference is calculated to obtain a stable threshold interval, and a threshold within the stable threshold interval is selected as a reasonable threshold for design wave height estimation. In this method, the stability of estimated values can be determined directly and objectively to realize wave height threshold selection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.