System and method for individual particle sizing using light scattering techniques
US10634598B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 2, 2015 |
| Grant date | Apr 28, 2020 |
| Priority date | — |
| Expiry date | Mar 21, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/1486
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A particle sizing system is provided that includes an optical source generating a light beam for illuminating particles in a monitored volume, a plurality of light deflectors, each positioned to receive and deflect light scattered by the particles, and an image capture device collecting scattered light deflected by each light deflector. The image capture device outputs an image including a plurality of sub-images, each generated from the collected light deflected from a respective one of the light deflectors. Each particle is imaged as a spot in each sub-image, the plurality of spots associated with each particle corresponding to a plurality of scattering angles. The system also includes a processing unit configured to identify the spots associated with the each particle in the sub-images, compute a spot parameter associated with each spot, and determine the size of each particle from its related spot parameters. A particle sizing method is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.