Patent · US Active

Scratch identification utilizing integrated defect maps

US10635040B2 · kind B2 · utility

0Cited by

3References

15Claims

0Family size

Assignee

HP INDIGO B.V. · NL

Inventors

Oded Perry · Nes Ziona, IL
Oren Haik · Nes Ziona, IL
Avi Malki · Nes Ziona, IL

Key dates

Filing date	Mar 21, 2017
Grant date	Apr 28, 2020
Priority date	—
Expiry date	Mar 21, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG03G15/55
WIPO fieldOptics
WIPO sectorInstruments

Abstract

In one example of the disclosure, a set of scanned images is accessed. The scanned images are scans of distinct printouts of subject images produced utilizing a photo imaging plate. A set of defect maps is created by comparing the scanned images to reference data for the subject images. The set of defect maps are combined into an integrated defect map. A scratch defect on the PIP is identified utilizing the integrated defect map.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.