Methods for testing a storage unit and apparatuses using the same
US10636506B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 31, 2017 |
| Grant date | Apr 28, 2020 |
| Priority date | — |
| Expiry date | Oct 13, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M13/2906
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The invention introduces a method for testing a storage unit, performed by a processing unit, including at least the following steps: after receiving a test write command from a host device through a first access interface, directing a second access interface to receive a first test pattern from a test writer and program the first test pattern into a PBA (Physical Block Address) of a storage unit; directing the second access interface to read a second test pattern from the PBA of the storage unit and output the second test pattern to a test reader; receiving a test result from the test reader; and generating a test message according to the test result and replying with the test message to the host device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.