Method and apparatus to detect lo leakage and image rejection using a single transistor
US10637517B2 · kind B2 · utility
0Cited by
9References
29Claims
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Key dates
| Filing date | Sep 5, 2018 |
| Grant date | Apr 28, 2020 |
| Priority date | — |
| Expiry date | Sep 5, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B2001/0408
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
Local oscillator (LO) leakage and Image are common and undesirable effects in typical transmitters. Typically, fairly complex hardware and algorithms are used to calibrate and reduce these impairments. A single transistor that draws essentially no dc current and occupies a very small area detects the LO leakage and Image signals. The single transistor operating as a square-law device is used to mix the signals at the input and output ports of a power amplifier. The mixed signal generated by the single transistor enables the simultaneous calibration of the LO leakage and Image Rejection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.