Method and apparatus for a precision position sensor
US10641597B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 22, 2018 |
| Grant date | May 5, 2020 |
| Priority date | — |
| Expiry date | Oct 31, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2210/60
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system to measure a parameter associated with a component, device, or system with a specified accuracy, including: providing one or more sensors operably disposed to detect the parameter; obtaining a coarse measurement of the parameter within a first range using the one or more sensors, wherein the first range includes minimum and maximum values for the parameter; obtaining a fine measurement of the parameter within a second range using the one or more sensors, wherein the second range is smaller than the first range and has a specified ratio to the first range that provides the specified accuracy; determining a current value of the parameter by combining the coarse and fine measurements; and providing the current value of the parameter to a communications interface, a storage device, a display, a control panel, a processor, a programmable logic controller, or an external device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.