Apparatuses and methods for measuring a clearance
US10641605B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Aug 17, 2017 |
| Grant date | May 5, 2020 |
| Priority date | — |
| Expiry date | Jul 13, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B17/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure provides an apparatus and method for measuring a clearance. The apparatus comprises: a first measurement component configured to be mounted on a first object in a mounted state thereof, so that a first measurement surface of the first measurement component is aligned with a first surface to be measured of the first object; and a second measurement component configured to be mounted on a second object in a mounted state thereof, so that a second measurement surface of the second measurement component is aligned with a second surface to be measured of the second object, wherein the first measurement component comprises a measurement instrument configured to measure a first distance between the measurement instrument and the first measurement surface and a second distance between the measurement instrument and the second measurement surface, wherein the clearance is calculated based on the first distance and the second distance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.