X-ray imaging system and method

US10641715B2 · kind B2 · utility

Assignees

• NUCTECH COMPANY LIMITED · CN
• TSINGHUA UNIVERSITY · CN

Inventors

• Zhiqiang Chen · Beijing, CN
• Li Zhang · Beijing, CN
• Le Shen · Beijing, CN
• Qingping Huang · Beijing, CN
• Xin Jin · Beijing, CN

Key dates

• Filing date: Dec 23, 2015
• Grant date: May 5, 2020
• Expiry date: Sep 25, 2036

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2223/419
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An X-ray imaging system and method are provided. The system may include: an X-ray source configured to irradiate X-ray beams; a first grating and a second grating arranged sequentially in an irradiation direction of the X-ray beams; a detector arranged at downstream of the second grating in the irradiation direction; and a controller and data processing device configured to control the X-ray source to irradiate the X-ray beams, to control the detector to receive X-ray beams passing through the first grating and the second grating to generate phase contrast information and/or dark field information, and to perform CT check on an object under check based on the phase contrast information and/or the dark field information to obtain a CT image. In this way, it is possible to obtain more characteristic information about the object under check, so as to achieve more precise material recognition and security check.