Method and apparatus for built-in self-test of CDR and non-CDR components with an on substrate test signal generator
US10641823B2 · kind B2 · utility
4Cited by
6References
12Claims
0Family size
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Key dates
| Filing date | Mar 17, 2017 |
| Grant date | May 5, 2020 |
| Priority date | — |
| Expiry date | Mar 17, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2856
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus comprises one or more non-clock and data recovery (CDR) components on a substrate, a signal generator on the substrate and coupled to at least one of the one or more non-CDR components, and a CDR component on the substrate and coupled to the one or more non-CDR components, wherein the CDR component is configured to recover clock data from a received signal by the CDR component, and configured to determine a signal based on the received signal and the clock data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.