Standardizing customer and test data and information collection for run time and historical profiling environments and workload comparisons
US10643228B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 14, 2016 |
| Grant date | May 5, 2020 |
| Priority date | — |
| Expiry date | Jul 19, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3698
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Aspects of the present invention include a method, system and computer program product. The method includes a processor determining one or more functional areas of focus for a profiling effort for the specific customer; determining one or more general functional areas of interest to the business entity and to a general set of customers; determining which environments and workloads of the specific customer to focus on in the profiling effort; determining data collection components of a platform for baseline environment and workload information for use in a data collection request for the specific customer; specifying any command and configuration data for the platform; specifying a baseline environment and workload data collection duration; and generating a data collection request for the specific customer that includes the baseline environment and workload data collection duration and time frames and the command and configuration data for the platform.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.