Systems, apparatuses, and methods for optical focusing in scattering samples
US10648934B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 17, 2019 |
| Grant date | May 12, 2020 |
| Priority date | — |
| Expiry date | Jan 17, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/323
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method includes applying, to a sample exhibiting optical scattering and having a emission particles distributed therein that exhibit spin-dependent fluorescence, a magnetic field to shift a resonance frequency of each emission particle in a position-dependent manner. The method also includes exciting the sample with an excitation beam that causes at least one emission particle to emit spin-dependent fluorescence and detecting the emitted spin-dependent fluorescence. The method also includes estimating a position of the emission particle(s) within the sample based on the spin-dependent fluorescence, the resonance frequency, and the magnetic field. The method also includes estimating optical transmission information for the sample based on a wavefront of the excitation beam and the estimated position. The optical transmission information including a measure of an optical field at each position of an emission particle.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.