Integrated analysis devices and related fabrication methods and analysis techniques
US10654715B2 · kind B2 · utility
0Cited by
5References
21Claims
0Family size
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Key dates
| Filing date | Dec 20, 2016 |
| Grant date | May 19, 2020 |
| Priority date | — |
| Expiry date | Dec 20, 2036 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/4981
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided are integrated analysis devices having features of macroscale and nanoscale dimensions, and devices that have reduced background signals and that reduce quenching of fluorophores disposed within the devices. Related methods of manufacturing these devices and of using these devices are also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.