Rejection of mechanical vibration induced noise in electrical measurements
US10656181B2 · kind B2 · utility
2Cited by
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20Claims
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Key dates
| Filing date | Mar 31, 2017 |
| Grant date | May 19, 2020 |
| Priority date | — |
| Expiry date | Jun 15, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R15/125
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electronic test measurement system can include a device under test (DUT) and an electronic test instrument that includes a signal input configured to receive an electrical signal from the DUT, a cooling mechanism, and a processor. The processor can be configured to determine a frequency at which the cooling mechanism should operate, cause the cooling mechanism to operate at the determined frequency, select a filter based on the determined frequency, and apply the filter to the electrical signal to reduce interference with the electrical signal resulting from mechanical vibrations of the cooling mechanism.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.