Multi-function electronic device testing
US10656206B1 · kind B1 · utility
13Cited by
3References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 15, 2017 |
| Grant date | May 19, 2020 |
| Priority date | — |
| Expiry date | Feb 17, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31908
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A multi-function test machine includes a table assembly, a robotic arm, one or more stimulators, one or more sensors, and a computing device for testing electronic devices. The multi-function tester may also include a camera test assembly and a universal device holder. The multi-function tester is capable of testing multiple systems of an electronic device concurrently, thus obviating the need for multiple test stations and operators.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.