Deep learning testability analysis with graph convolutional networks

US10657306B1 · kind B1 · utility

Assignee

• NVIDIA Corporation · US

Inventors

• Yuzhe Ma · Madison, US
• Haoxing Ren · Austin, US
• Brucek Kurdo Khailany · Austin, US
• Harbinder Sikka · San Jose, US
• Lijuan Luo · San Jose, US
• Karthikeyan Natarajan · Kanchinakote, IN

Key dates

• Filing date: Jul 24, 2019
• Grant date: May 19, 2020
• Expiry date: Jul 24, 2039

Classification

• Technology area (CPC G): Physics
• CPC primary: G06F30/398
• WIPO field: Computer technology
• WIPO sector: Electrical engineering

Abstract

Techniques to improve the accuracy and speed for detection and remediation of difficult to test nodes in a circuit design netlist. The techniques utilize improved netlist representations, test point insertion, and trained neural networks.