Drop testing apparatus
US10663384B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 2, 2017 |
| Grant date | May 26, 2020 |
| Priority date | — |
| Expiry date | Dec 7, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N3/40
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A drop testing apparatus is provided. The drop testing apparatus includes a plate connected to an external crane, a magnet holder provided at one end of the plate and fixed to the plate by an electromagnetic force, a counterweight provided at another end of the plate and facing the magnet holder, a dummy structure connected to the magnet holder through a connecting member and having a test specimen installed at one side thereof, a load cell unit provided between the dummy structure and the test specimen to measure impulse of the test specimen, and a controller configured to control the electromagnetic force to be created in the magnet holder and to receive the impulse measured by the load cell unit. When the electromagnetic force is cancelled, the connecting member disengages from the magnet holder, and the dummy structure and the test specimen fall onto the ground.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.