Refrigerant analyzer and a method of using the same
US10663396B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 28, 2016 |
| Grant date | May 26, 2020 |
| Priority date | — |
| Expiry date | Jan 22, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/4074
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and an analyzer for detecting impurities in refrigerant (e.g. methyl chloride (R40) or Chlorodifiuoromethane (R22)), wherein the refrigerant analyzer (12) includes a first sensing device (16), preferably a non-dispersive infrared sensor (NDIR), in flow communication with a second sensing device (18), preferably an electrochemical sensor. The first sensing device is configured to determine a first characteristic of a refrigerant (e.g. absorbance in the IR range), and the second sensing device is configured to detect a second characteristic of the refrigerant (e.g. concentration in ppmv). Preferably, the refrigerant analyzer is a part of a system for detecting impurities (10) and further preferably it comprises flow regulators (20), a scrubber (24) and a processor (22). The scrubber is preferably in flow communication with the first sensing device and it preferably comprises a packing material comprising alumina (Al2O3, aluminum oxide).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.