System for optically monitoring operating conditions in a sample analyzing apparatus
US10670454B2 · kind B2 · utility
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22Claims
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Key dates
| Filing date | Jan 18, 2019 |
| Grant date | Jun 2, 2020 |
| Priority date | — |
| Expiry date | Jan 18, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0238
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A sample analyzing apparatus for performing an optical-based measurement on a sample includes a housing, a first light source, excitation optics, a first light detector, emission optics, and a monitoring system, all of which are disposed in the housing. The monitoring system is configured for monitoring a movable component disposed in the housing. The monitoring system includes one or more light sources for illuminating the movable component, and one or more light detectors for detecting light reflected from the movable component in response to being illuminated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.