Patent · US Active

Particle detecting device and method for inspecting particle detecting device

US10670513B2 · kind B2 · utility

0Cited by
1References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 4, 2017
Grant dateJun 2, 2020
Priority date
Expiry dateApr 4, 2037

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2015/1006
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A particle detecting device includes an inspection light source 30, which emits inspection light, a flow cell 40, which is irradiated with the inspection light, and an oval mirror 50, which has a first focal point at a position of the flow cell 40 and has a hole 51 at an apex of the oval mirror 50.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.