Coating quality inspection system and method
US10670539B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 11, 2018 |
| Grant date | Jun 2, 2020 |
| Priority date | — |
| Expiry date | Dec 24, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An inspection system includes a light source, an imaging device, and one or more processors. The light source is configured to direct an illumination light having a controlled light characteristic towards a surface of a thermal barrier coating of a work piece. The imaging device is configured to capture image data of the surface of the thermal barrier coating by monitoring the illumination light reflected off the surface. The one or more processors are operably connected to the imaging device and configured to analyze the image data of the surface by comparing the image data to reference image data depicting a first designated microstructure. The first designated microstructure has an associated coating quality value. The one or more processors are configured to determine that the thermal barrier coating of the work piece has the first designated microstructure based on the analysis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.